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 Measure gate plate diameters as small as a micron
Manufacturing Field Emitter
Displays (FEDs) and ensuring the precision and quality
of their fabricated components presents a daunting challenge.
One such challenge involves precisely measuring hole
diameters and roundness in a FED gate plate with accuracy
of ± 0.01 µm or better. To accomplish this,
the Micro-Metric system analyzes the pixels within the
measurement window and builds a radial intensity profile
of the circle. High-precision non-contact measurement
in an FED production environment results in faster and
more accurate measurements with a higher repeatability
than a Scanning Electron Microscope (SEM).
Downloads:
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