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No matter what the requirement for ultra high-precision measurement, Micro-Metric has the ideal solution. Micro-Metric non-contact measurement systems utilize sub-pixel image feature detection with either field-of-view (FOV) or point-to-point (PTP) configurations for exceptional accuracy and repeatability. From etch-dimensions on hard disk drive (HDD) heads to semiconductor overlay measurements, we provide the accuracy you need for quality manufacturing. Click on the link below to learn more about ultra-high precision non-contact measurement.
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